281. X-ray metrology in semiconductor manufacturing

Author:

Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)

Subject: Semiconductors , Design and construction , Quality control,Integrated circuits , Measurement,Semiconductor wafers , Inspection,X-rays , Diffraction,Fluroscopy

Classification :
E-BOOK

282. high -performance system design

Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)

Subject: Metal oxide semiconductors, Complementary,Logic circuits,Low voltgage integrated circuits--Design and construction--Data processing,High performance processing

Classification :
TK
7871
.
99
.
M44O37
1999

283. transistor device and circuit design-electron-Hybrid CMOS single

Library: Central Library and Documents Center of Mazandaran University (Mazandaran)

Subject: Metal oxide semiconductors, Complementary. ; Integrated circuits ; Design and construction. ;

284. voltage analog CMOS circuits-The gm/ID methodology, a sizing tool for low

Library: Central Library and Documents Center of Mazandaran University (Mazandaran)

Subject: Metal oxide semiconductors, Complementary ; Design and construction. ; Low voltage integrated circuits ; Design and construction. ; Linear integrated circuits ; Design and construction. ;